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Anomalous charge loss from Floating-Gate Memory Cells due to heavy ions irradiation
G., Cellere; A., Paccagnella; L., Larcher; Chimenton, Andrea; J., Wiss; A., Candelori; A., Modelli
dettagli >>
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Institute of Electrical and Electronics Engineers Inc.,
IEEE Transactions on Nuclear Science
Vol. 49, No. 6, pp: 3051-3058, Anno: 2002 |
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Reliability and performance characterization of a mems-based non-volatile switch
R., Gaddi; C., Schepens; Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
dettagli >>
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Reliability Physics Symposium (IRPS), 2011 IEEE International,
Reliability Physics Symposium (IRPS), 2011 IEEE International
pp: 2G.2.1-2G.2.6, Anno: 2011 |
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Analysis of Edge Wordline Disturb in Multimegabit Charge Trapping Flash NAND arrays
Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
dettagli >>
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Reliability Physics Symposium (IRPS), 2011 IEEE International,
Reliability Physics Symposium (IRPS), 2011 IEEE International
pp: MY.4.1-MY.4.5, Anno: 2011 |
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Experimental characterization of SET Seasoning on Phase Change Memory arrays
Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
dettagli >>
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Institute of Electrical and Electornic Engineers (IEEE),
2010 IEEE International Memory Workshop
pp: 29-32, Anno: 2010 |
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Electrical Characterization and Modeling
of Phase Change Memory arrays
Chimenton, Andrea
dettagli >>
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ELECTRON DEVICES SOCIETY, IEEE,
Proceedings 2009 Non-Volatile Memory Technology Symposium
pp: 1-6, Anno: 2009 |
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A new automated methodology for Random Telegraph Signal identification and characterization: a case study on Phase Change Memory arrays
Chimenton, Andrea; Zambelli, Cristian; Olivo, Piero
dettagli >>
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IEEE,
2009 IEEE Proceedings of the International Reliability Physics Symposium, 47th Annual
Vol. 47, No. 1, pp: 128-133, Anno: 2009 |
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A statistical model of Erratic Erase based on an automated Random Telegraph Signal characterization technique
Chimenton, Andrea; Zambelli, Cristian; Olivo, Piero
dettagli >>
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Institute of Electrical and Electronics Engineers, Inc,
2009 IEEE International Reliability Physics Symposium, 47th Annual
Vol. 47, No. 1, pp: 896-901, Anno: 2009 |
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Analysis and Optimization of Erasing Waveform in Phase Change Memory Arrays
Zambelli, Cristian; Chimenton, Andrea; Olivo, Piero
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ELECTRON DEVICE SOCIETY, IEEE,
ESSDERC/ESSCIRC Conference Proceedings
pp: 213-216, Anno: 2009 |
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Evidence of erratic behaviors in p-channel floating gate memories and cell architectural solution
Chimenton, Andrea; Zambelli, Cristian; Olivo, Piero; F. P., Leisenberger; A., Wiesner; G., Schatzberger; E., Wachmann; M., Schrems
dettagli >>
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ELECTRON DEVICE SOCIETY, IEEE,
Proceedings 2009 Non-Volatile Memory Technology Symposium
pp: 63-66, Anno: 2009 |
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Set of electrical characteristic parameters suitable for reliability analysis of multimegabit Phase Change Memory arrays
Chimenton, Andrea; Zambelli, Cristian; A., Pirovano; Olivo, Piero
dettagli >>
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IEEE,
Non-Volatile Semiconductor Memory Workshop, 2008 and 2008 International Conference on Memory Technology and Design. NVSMW/ICMTD 2008. Joint
pp: 49-51, Anno: 2008 |
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Impact of short SET pulse sequence on Electronic Switching in Phase Change Memory arrays
Chimenton, Andrea; Zambelli, Cristian; Olivo, Piero
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IEEE,
Non-Volatile Memory Technology Symposium, 2008. NVMTS 2008. 9th Annual
pp: 7-11, Anno: 2008 |
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Statistical Methodologies for Integrated Circuits Design
Padovani, Andrea; Chimenton, Andrea; Olivo, Piero; Fantini, P; Vendrame, L; Mennillo, S.
dettagli >>
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IEEE,
Proceedings of the 3rd Conference on Ph.D. Research in Microelectronics and Electronics
pp: 277-280, Anno: 2007 |
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Monte-Carlo Simulations of Flash Memory Array Retention
Padovani, Andrea; L., Larcher; Chimenton, Andrea; P., Pavan
dettagli >>
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IEEE,
Proceedings of the IEEE International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA)
pp: 156-157, Anno: 2007 |
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Pulsed Tunnel Operating Non Volatile Flash Memories with SILC Reduction
F., Irrera; Chimenton, Andrea; Olivo, Piero
dettagli >>
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CNR-IMM,
14th Workshop on Dielectrics in Microelectronics (WoDiM)
pp: 52-53, Anno: 2006 |
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Ultra-short pulses improving performance and reliability in flash memories
Chimenton, Andrea; F., Irrera; Olivo, Piero
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IEEE,
IEEE Conference Proceedings
pp: 46-47, Anno: 2006 |
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Reliability of Flash Memory Erasing Operation under High Tunneling Electric Fields
Chimenton, Andrea; Olivo, Piero
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Electron Device Society and Reliability Society of the IEEE,
2004 IEEE International reliability physics symposium proceedings 42nd annual
pp: 216-221, Anno: 2004 |
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Erratic bits in Flash memories under Fowler-Nordheim programming
Chimenton, Andrea; Pellati, Paolo; Olivo, Piero
dettagli >>
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Japan Science and Technology Agency,
Solid State Device and materials
pp: 608-609, Anno: 2002 |
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Flash Memory Reliability: an improvement against Erratic Erase phenomena using the Constant Charge Erasing Scheme
Chimenton, Andrea; Olivo, Piero
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Japanese Physics Society,
International Conference on Solid State Device and Materials
pp: 156-157, Anno: 2002 |
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Impact of Tunnel Oxide Thickness on Erratic Erase in Flash Memories
Chimenton, Andrea; Olivo, Piero
dettagli >>
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IEEE,
IEEE European Solid State Device
pp: 363-366, Anno: 2002 |
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Drain-accelerated degradation of tunnel oxides in Flash memories
Chimenton, Andrea; Spinelli, A; Ielmini, D; Lacaita, A; Visconti, A; Olivo, Piero
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IEEE,
IEDM'02.Digest.International
pp: 167-170, Anno: 2002 |
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